Quasi-ballisticity of the electron transport in a 16nm silicon double-gate nMOSFET

Kai Zhao; Jungemann, Christoph; Xiaoyan Liu

Piscataway, NJ : IEEE (2011)
Contribution to a book, Contribution to a conference proceedings

In: 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC)
Page(s)/Article-Nr.: 2 S.