[Fachzeitschriftenartikel]
Massively parallel FDTD-FBMC simulations of nonlinear hole dynamics in silicon at cryogenic temperatures driven by intense EM THz pulses
In: Solid state electronics, 207, 108683, 2023
[DOI: 10.1016/j.sse.2023.108683]

Jungemann, Christoph (Corresponding author)
Thomson, M. D.
Meng, F.
Roskos, H. G.

[Buchbeitrag, Beitrag zu einem Tagungsband]
DC and Transient Microscopic Simulation of Nanowire NMOSFETs
In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) : 7-10 March 2023, 3 Seiten, 2023
[DOI: 10.1109/EDTM55494.2023.10102931]

Jungemann, Christoph (Corresponding author)
Rippchen, Tobias
Noei, Maziar
Linn, Tobias Sebastian

[Buchbeitrag]
Spherical Harmonics Expansion and Multi-Scale Modeling
In: Springer handbook of semiconductor devices / Massimo Rudan, Rossella Brunetti, Susanna Reggiani editors, 1413-1450, 2022
[DOI: 10.1007/978-3-030-79827-7_39]

Meinerzhagen, Bernd (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Device Simulation of the Dyakonov-Shur Plasma Instability for THz Wave Generation
In: 2022 IEEE Latin American Electron Devices Conference (LAEDC) : 4-6 July 2022 / publisher: IEEE, 4 Seiten, 2022
[DOI: 10.1109/LAEDC54796.2022.9908244]

Jungemann, Christoph (Corresponding author)
Noei, Maziar (Corresponding author)
Linn, Tobias Sebastian (Corresponding author)

[Beitrag zu einem Tagungsband, Fachzeitschriftenartikel]
Massively parallel FDTD full-band Monte Carlo simulations of electromagnetic THz pulses in p-doped silicon at cryogenic temperatures
In: Solid state electronics : SSE, 197, 108439, 2022
[DOI: 10.1016/j.sse.2022.108439]

Jungemann, Christoph (Corresponding author)
Meng, F.
Thomson, M. D.
Roskos, H. G.

[Fachzeitschriftenartikel]
Importance of valence-band anharmonicity and carrier distribution for third- and fifth-harmonic generation in Si:B pumped with intense terahertz pulses
In: Physical Review B, 106 (7), 075203, 2022
[DOI: 10.1103/PhysRevB.106.075203]

Meng, Fanqi (Corresponding author)
Walla, Frederik
ul-Islam, Qamar
Pashkin, Alexej
Schneider, Harald
et al.

[Fachzeitschriftenartikel]
Microscopic Simulation of the RF Performance of SiGe HBTs With Additional Uniaxial Mechanical Stress
In: IEEE transactions on electron devices : ED, 69 (9), 4803-4809, 2022
[DOI: 10.1109/TED.2022.3189322]

Dieball, Oliver (Corresponding author)
Rücker, Holger
Heinemann, Bernd
Jungemann, Christoph

[Fachzeitschriftenartikel]
Numerical aspects of a Godunov-type stabilization scheme for the Boltzmann transport equation
In: Journal of computational electronics, 21 (1), 153-168, 2022
[DOI: 10.1007/s10825-021-01846-w]

Noei, Maziar (Corresponding author)
Luckner, Paul
Linn, Tobias Sebastian
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
A Godunov-type Stabilization Scheme for Solving the Stationary and TransientBoltzmann Transport Equation
In: [IWCN 2021], 2021

Luckner, Paul (Corresponding author)
Leenders, Hendrik
Linn, Tobias
Noei, Maziar
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
A Maximum Principle for Drift-Diffusion Equations and the Scharfetter-Gummel Discretization
In: Scientific computing in electrical engineering : SCEE 2020, Eindhoven, The Netherlands, February 2020 / Martijn van Beurden, Neil Budko, Wil Schilders Editors, 45-52, 2021
[DOI: 10.1007/978-3-030-84238-3_5]

Bittner, Kai (Corresponding author)
Brachtendorf, Hans Georg
Linn, Tobias Sebastian
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Augmented Drift-Diffusion Transport for the Simulation of Advanced SiGe HBTs
In: [2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS, 2021-12-05 - 2021-12-08, Monterey, CA, USA], 4 Seiten, 2021
[DOI: 10.1109/BCICTS50416.2021.9682487]

Müller, Markus (Corresponding author)
Schröter, M.
Jungemann, Christoph
Weimer, C.

[Buch]
Special Issue on New Simulation Methodologies for Next-Generation TCAD Tools
In: IEEE transactions on electron devices, 68 (11), 5341-5928, C4 Seiten, 2021

Jungemann, Christoph (Editor)
Bonani, Fabrizio (Editor)
Cea, Stephen M. (Editor)
Gnani, Elena (Editor)
Hong, Sung-Min (Editor)
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
High-harmonic generation from weakly p-doped Si pumped with intense THz pulses
In: 2021 46th International Conference on Infrared, Millimeter, and Terahertz Waves : IRMMW-THz 2021 : Aug. 30-Sep. 3, 2021, Chengdu, China / conference organizer: University of Electronic Science and Technology of China, 1 Seite, 2021
[DOI: 10.1109/IRMMW-THz50926.2021.9567287]

Meng, Fanqi
Walla, Frederik
ul-Islam, Qamar
Thomson, Mark D.
Kovalev, Sergey
et al.

[Fachzeitschriftenartikel]
A Godunov-Type Stabilization Scheme for Large-Signal Simulations of a THz Nanowire Transistor Based on the Boltzmann Equation
In: IEEE transactions on electron devices : ED, 68 (11), 5407-5413, 2021
[DOI: 10.1109/TED.2021.3073677]

Noei, Maziar (Corresponding author)
Linn, Tobias Sebastian
Luckner, Paul
Jungemann, Christoph

[Buchbeitrag, Fachzeitschriftenartikel]
Foreword Special Issue on "New Simulation Methodologies for Next-Generation TCAD Tools"
In: IEEE transactions on electron devices, 68 (11), 5346-5349, 2021
[DOI: 10.1109/TED.2021.3116395]

Jungemann, Christoph
Bonani, Fabrizio
Cea, Stephen M.
Gnani, Elena
Hong, Sung-Min
et al.

[Fachzeitschriftenartikel]
Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor Devices
In: Physical review applied, 16 (1), 014026, 2021
[DOI: 10.1103/PhysRevApplied.16.014026]

Jech, Markus (Corresponding author)
El-Sayed, Al-Moatasem (Corresponding author)
Tyaginov, Stanislav (Corresponding author)
Waldhör, Dominic (Corresponding author)
Bouakline, Foudhil (Corresponding author)
et al.

[Fachzeitschriftenartikel]
Simulation of THz Oscillations in Semiconductor Devices Based on Balance Equations
In: Journal of scientific computing, 85 (1), 6, 2020
[DOI: 10.1007/s10915-020-01311-z]

Linn, Tobias Sebastian (Corresponding author)
Bittner, Kai
Brachtendorf, Hans Georg
Jungemann, Christoph

[Fachzeitschriftenartikel]
Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space : Implications and Peculiarities
In: IEEE transactions on electron devices : ED, 67 (8), 3315-3322, 2020
[DOI: 10.1109/TED.2020.3000749]

Jech, Markus (Corresponding author)
Rott, Gunnar
Reisinger, Hans
Tyaginov, Stanislav
Rzepa, Gerhard
et al.

[Fachzeitschriftenartikel]
Studying the switching variability in redox-based resistive switching devices
In: Journal of computational electronics, 19 (4), 1426-1432, 2020
[DOI: 10.1007/s10825-020-01537-y]

Abbaspour, Elhameh (Corresponding author)
Menzel, Stephan
Jungemann, Christoph

[Fachzeitschriftenartikel]
A numerical approach to quasi-ballistic transport and plasma oscillations in junctionless nanowire transistors
In: Journal of computational electronics, 19 (3), 975-986, 2020
[DOI: 10.1007/s10825-020-01488-4]

Noei, Maziar (Corresponding author)
Linn, Tobias Sebastian
Jungemann, Christoph

[Buchbeitrag]
The Langevin-Boltzmann Equation for Noise Calculation
In: Noise in Nanoscale Semiconductor Devices / Grasser, Tibor (Editor), 649-685, 2020
[DOI: 10.1007/978-3-030-37500-3_19]

Jungemann, Christoph (Corresponding author)

[Buchbeitrag, Beitrag zu einem Tagungsband]
First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation
In: 2019 International Electron Devices Meeting : technical digest / publisher: IEEE, 8993630, 2019
[DOI: 10.1109/IEDM19573.2019.8993630]

Jech, M.
Tyaginov, S.
Kaczer, B.
Franco, J.
Jabs, Dominic
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
On the Simulation of Plasma Waves in HEMTs and the Dyakonov-Shur Instability
In: Proceedings of 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2019 : September 4-6, 2019, Udine, Italy / edited by Francesco Driussi ; technical sponsor: IEEE Electron Devices Society, 4 Seiten, 2019
[DOI: 10.1109/SISPAD.2019.8870401]

Jungemann, Christoph (Corresponding author)
Linn, Tobias Sebastian (Corresponding author)
Kargar, Zeinab (Corresponding author)

[Fachzeitschriftenartikel]
RF analysis and noise characterization of junctionless nanowire FETs by a Boltzmann transport equation solver
In: Journal of computational electronics, 18 (4), 1347-1353, 2019
[DOI: 10.1007/s10825-019-01381-9]

Noei, Maziar (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Introducing a Cross-University Bachelor's Programme with Orientation Semester : Enabling a Permeable Academic Education System
In: Proceedings of the 2019 20th International Conference on Research and Education in Mechatronics (REM 2019) : University of Applied Sciences Upper Austria, Wels, Austria, May 23-24, 2019 / Peter Hehenberger (ed.), 6 Seiten, 2019
[DOI: 10.1109/REM.2019.8744132]

Bragard, Michael (Corresponding author)
Sube, Maike
Schneider, Maike
Jungemann, Christoph

[Fachzeitschriftenartikel]
Transient Simulation of Current and Electrophosphorescence in Organic Light-Emitting Diodes Using the Master Equation
In: IEEE transactions on electron devices : ED, 66 (7), 3012-3019, 2019
[DOI: 10.1109/TED.2019.2917017]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph

[Fachzeitschriftenartikel]
Master equation study of excitonic processes limiting the luminous efficacy in phosphorescent organic light-emitting diodes
In: Journal of applied physics, 125 (16), 165501, 2019
[DOI: 10.1063/1.5082164]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph

[Fachzeitschriftenartikel]
Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics : Part II: Theory
In: IEEE transactions on electron devices : ED, 66 (1), 241-248, 2018
[DOI: 10.1109/TED.2018.2873421]

Jech, Markus (Corresponding author)
Ullmann, Bianka
Rzepa, Gerhard
Tyaginov, Stanislav
Grill, Alexander
et al.

[Buchbeitrag, Fachzeitschriftenartikel]
Investigation of moments-based transport models applied to plasma waves and the Dyakonov-Shur instability
In: Semiconductor science and technology, 34 (1), 014002, 2019
[DOI: 10.1088/1361-6641/aaf27a]

Linn, Tobias Sebastian (Corresponding author)
Kargar, Zeinab
Jungemann, Christoph

[Fachzeitschriftenartikel]
KMC Simulation of the Electroforming, Set and Reset Processes in Redox-Based Resistive Switching Devices
In: IEEE transactions on nanotechnology, 17, 6, 2018
[DOI: 10.1109/TNANO.2018.2867904]

Abbaspour, Elhameh (Corresponding author)
Menzel, Stephan
Hardtdegen, Alexander
Hoffmann-Eifert, Susanne
Jungemann, Christoph

[Fachzeitschriftenartikel]
Microscopic simulation of RF noise in junctionless nanowire transistors
In: Journal of computational electronics, 17 (3), 986-993, 2018
[DOI: 10.1007/s10825-018-1199-4]

Noei, Maziar (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Fachzeitschriftenartikel]
Investigation of the Dyakonov-Shur instability for THz wave generation based on the Boltzmann transport equation
In: Semiconductor science and technology, 33 (10), 104001, 2018
[DOI: 10.1088/1361-6641/aad956]

Kargar, Zeinab (Corresponding author)
Linn, Tobias Sebastian
Jungemann, Christoph

[Fachzeitschriftenartikel]
Avalanche breakdown evolution under hot-carrier stress: a new microscopic simulation approach applied to a vertical power MOSFET
In: Journal of computational electronics, 17 (3), 1249-1256, 2018
[DOI: 10.1007/s10825-018-1196-7]

Jabs, Dominic (Corresponding author)
Bach, Karl Heinz
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Small-signal analysis of silicon nanowire transistors based on a Poisson/Schrödinger/Boltzmann solver
In: SISPAD 2017 : 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : September 7-9, 2017, Kamakura Prince Hotel, Kamakura, Japan / co-sponsored by the Japan Society of Applied Physics, the Murata Science Foundation, Support Center for Advanced Telecommunications Technology Research ; technical co-sponsored by the IEEE Electron Devices Society, 65-68, 2017
[DOI: 10.23919/SISPAD.2017.8085265]

Noei, Maziar (Corresponding author)
Ruic, Dino
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Simulation of THz emission by plasma waves in GaAs devices based on the Boltzmann transport equation
In: SISPAD 2017 : 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : September 7-9, 2017, Kamakura Prince Hotel, Kamakura, Japan / co-sponsored by the Japan Society of Applied Physics, the Murata Science Foundation, Support Center for Advanced Telecommunications Technology Research ; technical co-sponsored by the IEEE Electron Devices Society, 301-304, 2017
[DOI: 10.23919/SISPAD.2017.8085324]

Kargar, Zeinab (Corresponding author)
Ruic, Dino
Linn, Tobias Sebastian
Jungemann, Christoph

[Beitrag zu einem Tagungsband]
Transport modeling for plasma waves in THz devices
In: [International Workshop On Computational Nanotechnology, iwcn2017, 2017-06-05 - 2017-06-09, Windermere, UK], 74, 2017

Jungemann, Christoph
Kargar, Zeinab
Ruic, Dino

[Buchbeitrag, Beitrag zu einem Tagungsband]
Kinetic Monte Carlo modeling of the charge transport in a HfO2-based ReRAM with a rough anode
In: 2017 17th Non-Volatile Memory Technology Symposium (NVMTS) : conference proceedings : August 30-September 1, 2017, RWTH Aachen University, Germany / NVMTS (Non-Volatile Memory Technology Symposium) 2017 ; I. Institute of Physics (Physics of New Materials), RWTH Aachen University; Jülich; Electron Devices Society; IEEE, 4 Seiten, 2017
[DOI: 10.1109/NVMTS.2017.8171310]

Stehling, Wilhelm
Abbaspour, Elhameh
Jungemann, Christoph
Menzel, Stephan

[Buchbeitrag, Beitrag zu einem Tagungsband]
Random telegraph noise analysis in redox-based resistive switching devices using KMC simulations
In: SISPAD 2017 : 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : September 7-9, 2017, Kamakura Prince Hotel, Kamakura, Japan / co-sponsored by the Japan Society of Applied Physics, the Murata Science Foundation, Support Center for Advanced Telecommunications Technology Research ; technical co-sponsored by the IEEE Electron Devices Society, 313-316, 2017
[DOI: 10.23919/SISPAD.2017.8085327]

Abbaspour, Elhameh (Corresponding author)
Menzel, Stephan (Corresponding author)
Jungemann, Christoph (Corresponding author)

[Buchbeitrag, Beitrag zu einem Tagungsband]
Simulation of exciton effects in OLEDs based on the master equation
In: Organic Light Emitting Materials and Devices XXI : 6-8 August 2017, San Diego, California, United States / Franky So, Chihaya Adachi, Jang-Joo Kim, editors ; sponsored by SPIE ; cosponsored by Kolon Industries, Inc. (Korea, Republic of), 9 Seiten, 2017
[DOI: 10.1117/12.2269972]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph

[Fachzeitschriftenartikel]
Numerical simulation of plasma waves in a quasi-2D electron gas based on the Boltzmann transport equation
In: Journal of computational electronics, 16 (3), 487-496, 2017
[DOI: 10.1007/s10825-017-0993-8]

Kargar, Zeinab (Corresponding author)
Ruic, Dino
Linn, Tobias Sebastian
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Analysis of trap-induced noise in organic light-emitting diodes based on the master equation
In: 2017 International Conference on Noise and Fluctuations (ICNF) : 20-23 June 2017 / [Vilnius University, Center for Physical Sciences and Technology, IEEE Lithuania Section [und 6 andere]], 4 Seiten, 2017
[DOI: 10.1109/ICNF.2017.7985940]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Simulation of THz emission based on plasma wave excitation
In: 2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications (NEMO) : 17-19 May 2017 / NEMO 2017, IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications (May 17-19, 2017, Pabellón de México, Sevilla, Spain), 3 Seiten, 2017
[DOI: 10.1109/NEMO.2017.7964229]

Kargar, Zeinab (Corresponding author)
Ruic, Dino
Linn, Tobias Sebastian
Jungemann, Christoph

[Fachzeitschriftenartikel]
Si/SiGe:C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications
In: Proceedings of the IEEE, 105 (6), 1035-1050, 2017
[DOI: 10.1109/JPROC.2017.2669087]

Chevalier, Pascal (Corresponding author)
Schroter, Michael
Bolognesi, Colombo R.
d'Alessandro, Vincenzo
Alexandrova, Maria
et al.

[Fachzeitschriftenartikel]
Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit
In: IEEE transactions on electron devices, 64 (3), 923-929, 2017
[DOI: 10.1109/TED.2017.2653197]

Kamrani, Mohammad Hamed
Jabs, Dominic
d'Alessandro, Vincenzo
Rinaldi, Niccolo
Jacquet, Thomas
et al.

[Fachzeitschriftenartikel]
A Deterministic and Self-Consistent Solver for the Coupled Carrier-Phonon System in SiGe HBTs
In: IEEE transactions on electron devices, 64 (2), 361-367, 2017
[DOI: 10.1109/TED.2016.2640343]

Kamrani, Mohammad Hamed
Jabs, Dominic
d'Alessandro, Vincenzo
Rinaldi, Niccolo
Aufinger, Klaus
et al.

[Fachzeitschriftenartikel]
Numerical investigation of plasma effects in silicon MOSFETs for THz-wave detection
In: Solid state electronics, 128, 129-134, 2016
[DOI: 10.1016/j.sse.2016.10.030]

Jungemann, Christoph (Corresponding author)
Linn, Tobias Sebastian
Bittner, K.
Brachtendorf, H.-G.

[Buchbeitrag, Beitrag zu einem Tagungsband]
The EU DOTSEVEN Project: Overview and Results
In: 2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) : Austin, TX, USA, 23-26 October 2016 / sponsored by: The IEEE Electron Devices Society ; technically co-sponsored by: The IEEE Solid State Circuits Society, The IEEE Microwave Theory & Techniques Society, 4 Seiten, 2016
[DOI: 10.1109/CSICS.2016.7751070]

Schroter, M.
Boeck, J.
d'Alessandro, V.
Fregonese, S.
Heinemann, B.
et al.

[Fachzeitschriftenartikel]
Numerical Capacitance Analysis of Single-Layer OLEDs Based on the Master Equation
In: IEEE transactions on electron devices, 63 (12), 4919-4923, 2016
[DOI: 10.1109/TED.2016.2618484]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Physics-based hot-carrier degradation model for SiGe HBTs
In: SISPAD 2016 : 2016 International Conference on Simulation of Semiconductor Processes and Devices : September 6-8, 2016, Le Méridien Grand Hotel Nuremberg, Nuremberg, Germany / Eberhard Bär, Jürgen Lorenz, Peter Pichler (editors), 341-344, 2016
[DOI: 10.1109/SISPAD.2016.7605216]

Kamrani, Mohammad Hamed (Corresponding author)
Jabs, Dominic
d'Alessandro, Vincenzo
Rinaldi, Niccolo
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Noise simulation of bipolar organic semiconductor devices based on the master equation
In: SISPAD 2016 : 2016 International Conference on Simulation of Semiconductor Processes and Devices : September 6-8, 2016, Le Méridien Grand Hotel Nuremberg, Nuremberg, Germany / Eberhard Bär, Jürgen Lorenz, Peter Pichler (editors), 331-334, 2016
[DOI: 10.1109/SISPAD.2016.7605214]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph