[Fachzeitschriftenartikel]
Investigation of Transport Modeling for Plasma Waves in THz Devices
In: IEEE transactions on electron devices : ED, 63 (11), 4402-4408, 2016
[DOI: 10.1109/TED.2016.2608422]

Kargar, Zeinab (Corresponding author)
Linn, Tobias Sebastian
Ruic, Dino
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Simulation of Plasma Resonances in MOSFETs for THz-Signal Detection
In: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon : EURSOI-ULIS 2016 : Institute for Microelectronics, TU Wien, Vienna, Austria, January 25-27, 2016, 48-51, 2016
[DOI: 10.1109/ULIS.2016.7440049]

Jungemann, Christoph (Corresponding author)
Bittner, K. (Corresponding author)
Brachtendorf, H. G. (Corresponding author)

[Fachzeitschriftenartikel]
Microscopic noise simulation of long- and short-channel nMOSFETs by a deterministic approach
In: Journal of computational electronics, 15 (3), 809-819, 2016
[DOI: 10.1007/s10825-016-0840-3]

Ruic, Dino (Corresponding author)
Jungemann, Christoph

[Fachzeitschriftenartikel]
A review of recent advances in the spherical harmonics expansion method for semiconductor device simulation
In: Journal of computational electronics, 15 (3), 939-958, 2016
[DOI: 10.1007/s10825-016-0828-z]

Rupp, K. (Corresponding author)
Jungemann, Christoph (Corresponding author)
Hong, S.-M.
Bina, M.
Grasser, T.
et al.

[Fachzeitschriftenartikel]
Strain-modulated electronic and thermal transport properties of two-dimensional O-silica
In: Nanotechnology, 27 (26), 265706, 2016
[DOI: 10.1088/0957-4484/27/26/265706]

Han, Yang
Qin, Guangzhao
Jungemann, Christoph (Corresponding author)
Hu, Ming (Corresponding author)

[Buchbeitrag, Beitrag zu einem Tagungsband]
Langevin-Boltzmann approach for fluctuations in a hot-electron-hot-phonon system
In: 2015 International Conference on Noise and Fluctuations (ICNF) : 2 - 6 June 2015, Xi'an / [co-sponsored by the IEEE Electron Devices Society ...], 1-4, 2015
[DOI: 10.1109/ICNF.2015.7288623]

Ramonas, Mindaugas (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
A self-consistent solution of the Poisson, Schrödinger and Boltzmann equations for GaAs devices by a deterministic solver
In: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2015) : Washington, DC, USA, 9 - 11 September 2015 / [technical sponsor IEEE], 361-364, 2015
[DOI: 10.1109/SISPAD.2015.7292334]

Kargar, Zeinab (Corresponding author)
Ruić, Dino
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Small signal and microscopic noise simulation of an nMOSFET by a self-consistent, semi-classical and deterministic approach
In: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2015) : Washington, DC, USA, 9 - 11 September 2015 / [technical sponsor IEEE], 20-23, 2015
[DOI: 10.1109/SISPAD.2015.7292248]

Ruic, Dino (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Electrothermal simulation of SiGe HBTs and investigation of experimental extraction methods for junction temperature
In: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2015) : Washington, DC, USA, 9 - 11 September 2015 / [technical sponsor IEEE], 108-111, 2015
[DOI: 10.1109/SISPAD.2015.7292270]

Kamrani, Mohammad Hamed (Corresponding author)
Kochubey, Tatiana
Jabs, Dominic
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Simulation of bipolar organic semiconductor devices based on the master equation including generation and recombination
In: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2015) : Washington, DC, USA, 9 - 11 September 2015 / [technical sponsor IEEE], 136-139, 2015
[DOI: 10.1109/SISPAD.2015.7292277]

Zhou, Weifeng (Corresponding author)
Zimmermann, Christoph
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
The role of the interface reactions in the electroforming of redox-based resistive switching devices using KMC simulations
In: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2015) : Washington, DC, USA, 9 - 11 September 2015 / [technical sponsor IEEE], 293-296, 2015
[DOI: 10.1109/SISPAD.2015.7292317]

Abbaspour, Elhameh (Corresponding author)
Menzel, Stephan
Jungemann, Christoph

[Fachzeitschriftenartikel]
Field-induced detrapping in doped organic semiconductors with Gaussian disorder and different carrier localizations on host and guest sites
In: Physical review / B, 92 (10), 104201, 2015
[DOI: 10.1103/PhysRevB.92.104201]

Scheb, M.
Zimmermann, Christoph
Jungemann, Christoph

[Fachzeitschriftenartikel]
Entwicklung der Simulation in der Mikro-/Nanoelektronik
In: VDE-Dialog : das Technologie-Magazin, 2015 (03), ITG-News: 9-11, 2015

Jungemann, Christoph (Corresponding author)

[Fachzeitschriftenartikel]
A Robust Algorithm for Microscopic Simulation of Avalanche Breakdown in Semiconductor Devices
In: IEEE transactions on electron devices, 62 (8), 2614-2619, 2015
[DOI: 10.1109/TED.2015.2446132]

Jabs, Dominic (Corresponding author)
Jungemann, Christoph (Corresponding author)
Bach, Karl Heinz (Corresponding author)

[Fachzeitschriftenartikel]
Simulation of electronic noise in disordered organic semiconductor devices based on the master equation
In: Journal of computational electronics, 14 (1), 37-42, 2015
[DOI: 10.1007/s10825-014-0619-3]

Jungemann, Christoph (Corresponding author)

[Fachzeitschriftenartikel]
A Deterministic approach to noise in a non-equilibrium electron-phonon system based on the Boltzmann equation
In: Journal of computational electronics, 14 (1), 43-50, 2015
[DOI: 10.1007/s10825-014-0627-3]

Ramonas, Mindaugas
Jungemann, Christoph

[Fachzeitschriftenartikel]
Numerical aspects of noise simulation in MOSFETs by a Langevin-Boltzmann solver
In: Journal of computational electronics, 14 (1), 21-36, 2015
[DOI: 10.1007/s10825-014-0642-4]

Ruic, Dino
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
A semi-distributed method for inductor de-embedding
In: 2014 International Conference on Microelectronic Test Structures (ICMTS 2014) : Udine, Italy, 24 - 27 March 2014 / [organized by the Università degli Studi di Udine. Co-sponsored by the IEEE Electron Devices Society], 141-145, 2014
[DOI: 10.1109/ICMTS.2014.6841482]

Dang, J. (Corresponding author)
Noculak, Achim
Korndörfer, F.
Jungemann, Christoph
Meinerzhagen, B.

[Buchbeitrag, Beitrag zu einem Tagungsband]
A fully integrated 5.5 GHz cross-coupled VCO with high output power using 0.25μm CMOS technology
In: 21st IEEE International Conference on Electronics, Circuits, and Systems (ICECS), 2014 : 7 - 10 Dec. 2014, Marseille, France / supported by IEEE; CAS ..., 255-258, 2014
[DOI: 10.1109/ICECS.2014.7049970]

Dang, J. (Corresponding author)
Noculak, A.
Haddadinejad, S.
Jungemann, Christoph
Meinerzhagen, B.

[Beitrag zu einem Tagungsband]
Validity of Macroscopic Noise Models in the case of High-Frequency Bipolar Transistors
In: 2014 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2014 ; Workshop 'Compact Modeling -Enabling Better Insight of Device FeaturesSeptember' ; September, 8, 2014, Yokohama, Japan, 2014

Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Avalanche Breakdown of pn-junctions - Simulation by Spherical Harmonics Expansion of the Boltzmann Transport Equation
In: 2014 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2014 ; September 9 - 11, Yokohama, Japan ; extended abstracts, 173-176, 2014

Jabs, Dominic
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
DC, AC and Noise Simulation of Organic Semiconductor Devices based on the Master Equation
In: 2014 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2014 ; September 9 - 11, Yokohama, Japan ; extended abstracts, 137-140, 2014

Jungemann, Christoph
Zimmermann, Christoph

[Beitrag zu einem Tagungsband]
Interface states charges as a vital component for HC degradation modeling
In: [ESREF 2014 : 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis] : 29.09. - 02.10.2014 - TU Berlin, 3 S., 2014

Tyaginov, S. E.
Starkov, I. A.
Triebl, O.
Cervenka, J.
Jungemann, Christoph
et al.

[Buchbeitrag]
Technology Computer Aided Design
In: Guide to state-of-the-art electron devices / edited by Joachim N. Burghartz, Institute for microelectronics Stuttgart (IMS CHIPS), Germany, 97-97, 2013

Esseni, David
Jungemann, Christoph
Lorenz, Jürgen
Palestri, Pierpaolo
Sangiorgi, Enrico
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Spherical Harmonics Solver for Coupled Hot-Electron : Hot-Phonon System
In: 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : Glasgow, 3-5 Sept. 2013, 360-363, 2013
[DOI: 10.1109/SISPAD.2013.6650649]

Ramonas, Mindaugas (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
A self-consistent solution of the Poisson, Schrödinger and Boltzmann equations by a full Newton-Raphson approach for nanoscale semiconductor devices
In: 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : Glasgow, 3-5 Sept. 2013, 356-359, 2013
[DOI: 10.1109/SISPAD.2013.6650648]

Ruic, Dino (Corresponding author)
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Investigation of Electronic Noise in THz SiGe HBTs by Microscopic Simulation
In: Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE, 8 S., 2013
[DOI: 10.1109/BCTM.2013.6798131]

Jungemann, Christoph (Corresponding author)
Hong, Sung-Min

[Beitrag zu einem Tagungsband, Fachzeitschriftenartikel]
Deterministic solvers for the Boltzmann transport equation of 3D and quasi-2D electron and hole systems in SiGe devices
In: Solid state electronics : SSE, 84, 112-119, 2013
[DOI: 10.1016/j.sse.2013.02.034]

Jungemann, Christoph (Corresponding author)
Pham, A.-T.
Hong, S.-M.
Smith, L.
Meinerzhagen, B.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Comparison of noise predictions by commercial TCAD device simulator to results from a spherical harmonics expansion solver
In: SISPAD 2012 : the International Conference on Simulation of Semiconductor Processes and Devices ; September 5-7, 2012, Denver, Colo., 356-359, 2012

Dinh, T. V.
Klaassen, D. B. M.
Vanhoucke, T.
Gridelet, E.
Mertens, H.
et al.

[Fachzeitschriftenartikel]
Systematic Compact Modeling of Correlated Noise in Bipolar Transistors
In: IEEE transactions on microwave theory and techniques : MTT, 60 (11), 3403-3412, 2012
[DOI: 10.1109/TMTT.2012.2216284]

Herricht, Jörg
Sakalas, Paulius
Ramonas, Mindaugas
Schroter, Michael
Jungemann, Christoph
et al.

[Beitrag zu einem Tagungsband]
Bipolar Spherical Harmonics Expansions of the Boltzmann Transport Equation
In: 2012 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2012), Denver 5-7 September, 2012, 19-22, 2012

Rupp, K.
Jungemann, Christoph
Bina, M.
Jüngel, A.
Grasser, T.

[Fachzeitschriftenartikel]
A deterministic method study of the impact of the Pauli principle in double-gate MOSFETs
In: Chinese physics letters, 21 (11), 118501, 2012
[DOI: 10.1088/1674-1056/21/11/118501]

Kai, Zhao
Jungemann, Christoph
Xiao-Yan, Liu

[Buchbeitrag, Beitrag zu einem Tagungsband]
Impact of Gate Oxide Thickness Variations on Hot-Carrier Degradation
In: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : [SINGAPORE JUL 02-06, 2012], 5 S., 2012
[DOI: 10.1109/IPFA.2012.6306265]

Tyaginov, Stanislav
Starkov, Ivan
Triebl, Oliver
Karner, M.
Kernstock, Ch.
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Analytical solutions of a spatially homogeneous Boltzmann equation for cyclostationary noise including generation/recombination
In: Nonlinear dynamics of electronic systems - NDES 2012 : Juli 11 - 13, 2012, Wolfenbüttel, Germany ; 20th edition of the International Conference on Nonlinear Dynamics of Electronic Systems / VDE-ITG ..., 4 S., 2012

Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Deterministic Simulation of 3D and Quasi-2D Electron and Hole Systems in SiGe Devices
In: [European Solid-State Device Research Conference], 318-321, 2012
[DOI: 10.1109/ESSDERC.2012.6343397]

Jungemann, Christoph
Pham, Anh-Tuan
Hong, Sung-Min
Meinerzhagen, Bernd

[Beitrag zu einem Tagungsband, Fachzeitschriftenartikel]
Quantum simulations of electrostatics in si cylindrical junctionless nanowire nfets and pfets with a homogeneous channel including strain and arbitrary crystallographic orientations
In: Solid state electronics : SSE, 71, 30-36, 2012
[DOI: 10.1016/j.sse.2011.10.016]

Anh-Tuan Pham
Soree, Bart
Magnus, Wim
Jungemann, Christoph
Meinerzhagen, Bernd
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Quantum simulations of electrostatics in Si cylindrical nanowire pinch-off nFETs and pFETs with a homogeneous channel including strain and arbitrary crystallographic orientations
In: Ulis 2011 ultimate integration on silicon : Cork, Ireland, 14 - 16 March 2011 ; [International Conference on Ultimate Integration on Silicon], 4 S., 2011
[DOI: 10.1109/ULIS.2011.5757989]

Pham, Anh-Tuan
Soree, B.
Magnus, W.
Jungemann, Christoph
Meinerzhagen, B.
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Numerical Modeling of Noise and Transport in SOI Devices
In: Advanced semiconductor-on-insulator technology and related physics 15 : [the Fifteenth International Symposium on Advanced Semiconductor-on-Insulator Technology and Related Physics was part of the 219th meeting of the Electrochemical Society, held on May 1 - May 6, 2011, in Montreal, Canada] / sponsoring division: Electronics and Photonics. Ed.: Y. Omura, ..., 303-312, 2011
[DOI: 10.1149/1.3570810]

Meinerzhagen, Bernd
Pham, Anh-Tuan
Hong, Sung-Min
Jungemann, Christoph

[Fachzeitschriftenartikel]
Hot-carrier degradation caused interface state profile; Simulation versus experiment
In: Journal of vacuum science & technology : JVST / B, 29 (1), 01AB09, 2011
[DOI: 10.1116/1.3534021]

Starkov, I. A.
Tyaginov, S. E.
Enichlmair, H.
Cervenka, J.
Jungemann, Christoph
et al.

[Fachzeitschriftenartikel]
An Efficient Approach to Include Full-Band Effects in Deterministic Boltzmann Equation Solver Based on High-Order Spherical Harmonics Expansion
In: IEEE transactions on electron devices : ED, 58 (5), 1287 -1294, 2011
[DOI: 10.1109/TED.2011.2108659]

Jin, Seong Hoon
Hong, Sung-Min
Jungemann, Christoph

[Fachzeitschriftenartikel]
Improving the high-frequency performance of SiGe HBTs by a global additional uniaxial stress
In: Solid state electronics : SSE, 60 (1), 58-64, 2011
[DOI: 10.1016/j.sse.2011.01.027]

Dinh, Thanh Viet
Hong, Sung-Min
Jungemann, Christoph

[Buch]
Deterministic Solvers for the Boltzmann Transport Equation
In: Computational Microelectronics SpringerLink : Bücher, 2011
[DOI: 10.1007/978-3-7091-0778-2]

Hong, Sung-Min
Pham, Anh-Tuan
Jungemann, Christoph

[Buchbeitrag, Beitrag zu einem Tagungsband]
Impact of the carrier distribution function on hot-carrier degradation modeling
In: 2011 proceedings of the European Solid-State Device Research Conference (ESSDERC 2011) : Helsinki, Finland, 12 - 16 September 2011 / [sponsors: IEEE ...], 151-154, 2011
[DOI: 10.1109/ESSDERC.2011.6044212]

Tyaginov, Stanislav
Starkov, Ivan
Jungemann, Christoph
Enichlmair, Hubert
Park, Jong-Mun
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Analysis of worst-case hot-carrier degradation conditions in the case of n- and p-channel high-voltage MOSFETs
In: 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2011) : Osaka, Japan, 8 - 10 September 2011 / [co-sponsored by Japan Soc. of Applied Physics ... Technical co-sponsored by The IEEE Electronic Devices Society ...], 127-130, 2011
[DOI: 10.1109/SISPAD.2011.6035066]

Starkov, Ivan
Ceric, Hajdin
Enichlmair, Hubert
Jong-Mun Park
Tyaginov, Stanislav
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Secondary generated holes as a crucial component for modeling of HC degradation in high-voltage n-MOSFET
In: 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2011) : Osaka, Japan, 8 - 10 September 2011 / [co-sponsored by Japan Soc. of Applied Physics ... Technical co-sponsored by The IEEE Electronic Devices Society ...], 123-126, 2011
[DOI: 10.1109/SISPAD.2011.6035065]

Tyaginov, Stanislav
Starkov, Ivan
Triebl, Oliver
Ceric, Hajdin
Grasser, Tibor
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
Quasi-ballisticity of the electron transport in a 16nm silicon double-gate nMOSFET
In: 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC), 2 S., 2011
[DOI: 10.1109/EDSSC.2011.6117581]

Kai Zhao
Jungemann, Christoph
Xiaoyan Liu

[Beitrag zu einem Tagungsband, Fachzeitschriftenartikel]
An analytical approach for physical modeling of hot-carrier induced degradation
In: Microelectronics reliability, 51 (9-11 Special Issue: SI), 1525-1529, 2011
[DOI: 10.1016/j.microrel.2011.07.089]

Tyaginov, S.
Starkov, I.
Enichlmair, H.
Jungemann, Christoph
Park, J. M.
et al.

[Beitrag zu einem Tagungsband, Fachzeitschriftenartikel]
Comparison of strained SiGe heterostructure-on-insulator (001) and (110) PMOSFETs: C-V characteristics, mobility, and ON current
In: Solid state electronics : SSE, 65 (November-December 2011), 64-71, 2011
[DOI: 10.1016/j.sse.2011.06.021]

Pham, Anh-Tuan
Zhao, Qing-Tai
Jungemann, Christoph
Meinerzhagen, Bernd
Manti, Siegfried
et al.

[Fachzeitschriftenartikel]
Physical and Electrical Performance Limits of High-Speed SiGeC HBTs-Part I: Vertical Scaling
In: IEEE transactions on electron devices : ED, 58 (11), 3687-3696, 2011
[DOI: 10.1109/TED.2011.2163722]

Schröter, Michael
Wedel, Gerald
Heinemann, Bernd
Jungemann, Christoph
Krause, Julia
et al.

[Buchbeitrag, Beitrag zu einem Tagungsband]
High-order spherical harmonics solution of the Boltzmann equation and noise modeling
In: 2010 14th International Workshop on Computational Electronics (IWCE 2010) : Pisa, Italy, 26 - 29 October 2010 / ed.: G. Basso ..., 17-22, 2010
[DOI: 10.1109/IWCE.2010.5677930]

Jungemann, Christoph
Hong, Sung-Min
Matz, G.