Monte Carlo Simulation of Charge Carrier Injection in Twin Flash Memory Devices during Program and Erase

Hagenbeck, R.; Decker, S.; Haibach, P.; Mikolajick, T.; Tempel, G.; Isler, M.; Jungemann, Christoph; Meinerzhagen, Bernd

Piscataway, NJ : IEEE Service Center (2006)
Contribution to a book, Contribution to a conference proceedings

In: 2006 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2006 ; Monterey, California, USA, 6 - 8 September 2006 / sponsored by IEEE Electron Devices Society
Page(s)/Article-Nr.: 322-325

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier