Impact of the Velocity Overshoot on the Performance of NMOSFETs with Gate Lengths from 80 to 250nm

Jungemann, Christoph; Meinerzhagen, Bernd

Paris : Ed. Frontières (1999)
Contribution to a book, Contribution to a conference proceedings

In: Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13 - 15 September 1999 / IMEC. Ed. by H. E. Maes ...
Page(s)/Article-Nr.: 236-239


  • Chair and Institute of Theoretical Electrical Engineering [611410]