Modeling the lifetime of a lateral DMOS transistor in repetitive clamping mode

Riedlberger, E.; Keller, R.; Reisinger, H.; Gustin, W.; Spitzer, A.; Stecher, M.; Jungemann, Christoph

Piscataway, NJ : IEEE (2010)
Contribution to a book, Contribution to a conference proceedings

In: 2010 IEEE International Reliability Physics Symposium : IRPS 2010 ; Anaheim, California, USA, 2 - 6 May 2010
Page(s)/Article-Nr.: 175-181

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier