A Soft Threshhold Lucky Electron model improved for Device Simulations under low voltage conditions

Jungemann, Christoph; Thoma, R.; Meinerzhagen, Bernd; Engl, W. L.

Seoul (1995)
Contribution to a book, Contribution to a conference proceedings

In: ICVC'95 : Proceedings of the 4th International Conference on VLSI and CAD ; Seoul, 1995
Page(s)/Article-Nr.: 211-214


  • Chair and Institute of Theoretical Electrical Engineering [611410]