Investigation of the Influence of Impact Ionization Feedback on the Spatial Distribution of Hot Carriers in an NMOSFET

Jungemann, Christoph; Yamaguchi, S.; Goto, H.

Gif-sur-Yvette : Ed. Frontières (1997)
Contribution to a book, Contribution to a conference proceedings

In: Proceedings of the 27th European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 1997 / ESSDERC '97. Ed. by H. Grünbacher
Page(s)/Article-Nr.: 336-339

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier