Hot-carrier degradation modeling using full-band Monte-Carlo simulations

Tyaginov, S. E.; Starkov, I. A.; Triebl, O.; Cervenka, J.; Jungemann, Christoph; Carniello, S.; Park, J. M.; Enichlmair, H.; Karner, M.; Kernstock, C.; Seebacher, E.; Minixhofer, R.; Ceric, H.; Grasser, T.

Piscataway, NJ : IEEE (2010)
Contribution to a book, Contribution to a conference proceedings

In: 2010 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) : Singapore, 5 - 9 July 2010 / [organised by IEEE Reliability/CPMT/ED Singapore Chapter. Technically co-sponsored by IEEE Electron Devices Society ...]
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  • Chair and Institute of Theoretical Electrical Engineering [611410]