An Accurate and Efficient Methodology for RF Noise Simulations of nm-scale MOSFETs Based on Langevin-type Drift-diffusion Model

Decker, S.; Jungemann, Christoph; Neinhüs, Burkhard; Meinerzhagen, Bernd

River Edge, N.J.[u.a.] : World Scientific (2001)
Contribution to a book, Contribution to a conference proceedings

In: Noise in physical systems and 1/f fluctuations : proceedings of the 16th international conference, Gainesville, Florida, USA, 22 - 25 October 2001 / ICNF 2001. Ed.: Gijs Bosman
Page(s)/Article-Nr.: 659-662


  • Chair and Institute of Theoretical Electrical Engineering [611410]