Microscopic modeling of impact-ionization noise in SiGe heterojunction bipolar transistors

Ramonas, Mindaugas; Jungemann, Christoph; Sakalas, Paulius; Schröter, Michael; Kraus, Wolfgang

Bellingham, Wash : SPIE (2007)
Contribution to a book, Contribution to a conference proceedings

In: Noise and fluctuations in circuits, devices, and materials : 21 - 24 May 2007, Florence, Italy ; [Conference on Noise and Fluctuations in Circuits, Devices, and Materials] / sponsored and publ. by SPIE. Massimo Macucci ..., ed.
Page(s)/Article-Nr.: 66001F, 12 S.

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier