Hydrodynamic Simulation of RF Noise in Deep-submicron MOSFETs

Oh, Tae-Young; Jungemann, Christoph; Dutton, R. W.

Piscataway, NJ : IEEE Service Center (2003)
Contribution to a book, Contribution to a conference proceedings

In: 2003 IEEE International Conference on Simulation of Semiconductor Devices and Processes : SISPAD 2003 ; Boston, Massachusetts, USA, 3 - 5 September 2003 / sponsored by IEEE Electron Devices Society
Page(s)/Article-Nr.: 87-90

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier