Compact modeling of drain and gate current noise for RF CMOS

Scholten, A. J.; Tiemeijer, L. F.; van Langevelde, R.; Havens, R. J.; Venezia, V. C.; Zegers-van Duijnhoven, A. T. A.; Neinhüs, Burkhard; Jungemann, Christoph; Klaassen, D. B. M.

Piscataway, NJ : IEEE Operations Center (2002)
Contribution to a book, Contribution to a conference proceedings

In: Technical digest / IEDM, International Electron Devices Meeting 2002 : San Francisco, CA, December 8 - 11, 2002 / sponsored by Electron Devices Society of IEEE
Page(s)/Article-Nr.: 129-132


  • Chair and Institute of Theoretical Electrical Engineering [611410]