Investigation of Compact Models for RF Noise in SiGe HBTs by Hydrodynamic Device Simulation

Jungemann, Christoph; Neinhüs, Burkhard; Meinerzhagen, Bernd; Dutton, Robert W.

New York, NY : IEEE (2004)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 51
Issue: 6
Page(s)/Article-Nr.: 956-961

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier