On the Accuracy and Efficiency of Substrate Current Calculations for Sub-$mu$m n-MOSFETs

Jungemann, Christoph; Yamaguchi, S.; Goto, H.

New York, NY : IEEE (1996)
Journal Article

In: IEEE electron device letters : EDL
Volume: 17
Issue: 10
Page(s)/Article-Nr.: 464-466

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier