Study of Charge Carrier Quantization in Strained Si-nMOSFETs

Nguyen, C. D.; Pham, A. T.; Jungemann, Christoph; Meinerzhagen, B.

Oxford : Pergamon, Elsevier Science (2005)
Contribution to a conference proceedings, Journal Article

In: Materials science in semiconductor processing
Volume: 8
Issue: 1/3
Page(s)/Article-Nr.: 363-366

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier