A soft threshold lucky electron model for efficient and accurate numerical device simulation

Jungemann, Christoph; Thoma, R.; Engl, W. L.

Amsterdam : Elsevier (1996)
Journal Article

In: Solid state electronics : SSE
Volume: 39
Issue: 7
Page(s)/Article-Nr.: 1079-1086

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier