High-frequency noise in nanoscale metal oxide semiconductor field effect transistors

Navid, Reza; Jungemann, Christoph; Lee, Thomas H.; Dutton, Robert W.

Melville, NY : American Institute of Physics, AIP [u.a.] (2007)
Journal Article

In: Journal of applied physics
Volume: 101
Page(s)/Article-Nr.: 124501

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier