Hierarchical 2-D DD and HD noise simulations of Si and SiGe devices : Part II: Results

Jungemann, Christoph; Neinhüs, B.; Decker, S.; Meinerzhagen, Bernd

New York, NY : IEEE (2002)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 49
Issue: 7
Page(s)/Article-Nr.: 1258-1264


  • Chair and Institute of Theoretical Electrical Engineering [611410]