A Deterministic Approach to RF Noise in Silicon Devices based on the Langevin Boltzmann equation

Jungemann, Christoph

New York, NY : IEEE (2007)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 54
Issue: 5
Page(s)/Article-Nr.: 1185-1192

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier