Impact Ionization Noise in SiGe HBTs: Comparison of Device and Compact Modeling With Experimental Results

Sakalas, Paulius; Ramonas, Mindaugas; Schröter, Michael; Jungemann, Christoph; Shimukovitch, Artur; Kraus, Wolfgang

New York, NY : IEEE (2009)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 56
Issue: 2
Page(s)/Article-Nr.: 328-336

Institutions

  • Chair and Institute of Theoretical Electrical Engineering [611410]

Identifier