A semiempirical surface scattering model for quantum corrected full-band Monte-Carlo simulation of biaxially strained Si/SiGe NMOSFETs

Pham, Anh-Tuan; Nguyen, C. D.; Jungemann, Christoph; Meinerzhagen, Bernd

Amsterdam : Elsevier (2006)
Contribution to a conference proceedings, Journal Article

In: Solid state electronics : SSE
Volume: 50
Issue: 4
Page(s)/Article-Nr.: 694-700


  • Chair and Institute of Theoretical Electrical Engineering [611410]