DC and Transient Microscopic Simulation of Nanowire NMOSFETs

Jungemann, Christoph (Corresponding author); Rippchen, Tobias; Noei, Maziar; Linn, Tobias Sebastian

Piscataway, NJ : IEEE (2023)
Contribution to a book, Contribution to a conference proceedings

In: Strengthen the global semiconductor research collaboration after the COVID-19 pandemic : 7th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference 2023 : IEEE EDTM 2023 : March 7th-10th, 2023, Coex, Seoul, Korea / organized by IEEE Electron Devices Society; SK hynix; KoNTRS, Korea Nanotechnology Research Society
Page(s)/Article-Nr.: 3 Seiten


  • Chair and Institute of Theoretical Electrical Engineering [611410]