Impact of the carrier distribution function on hot-carrier degradation modeling

Tyaginov, Stanislav; Starkov, Ivan; Jungemann, Christoph; Enichlmair, Hubert; Park, Jong-Mun; Grasser, Tibor

Piscataway, NJ : IEEE (2011)
Contribution to a book, Contribution to a conference proceedings

In: 2011 proceedings of the European Solid-State Device Research Conference (ESSDERC 2011) : Helsinki, Finland, 12 - 16 September 2011 / [sponsors: IEEE ...]
Page(s)/Article-Nr.: 151-154

Identifier