Physical and Electrical Performance Limits of High-Speed SiGeC HBTs-Part I: Vertical Scaling
Schröter, Michael; Wedel, Gerald; Heinemann, Bernd; Jungemann, Christoph; Krause, Julia; Chevalier, Pascal; Chantre, Alain
New York, NY : IEEE (2011)
Journal Article
In: IEEE transactions on electron devices : ED
Volume: 58
Issue: 11
Page(s)/Article-Nr.: 3687-3696
Identifier
- DOI: 10.1109/TED.2011.2163722
- RWTH PUBLICATIONS: RWTH-CONV-032262