An analytical approach for physical modeling of hot-carrier induced degradation

Tyaginov, S.; Starkov, I.; Enichlmair, H.; Jungemann, Christoph; Park, J. M.; Seebacher, E.; Orio, R.; Ceric, H.; Grasser, T.

Oxford [u.a.] : Pergamon Press (2011)
Contribution to a conference proceedings, Journal Article

In: Microelectronics reliability
Volume: 51
Issue: 9-11 Special Issue: SI
Page(s)/Article-Nr.: 1525-1529