Comparison of strained SiGe heterostructure-on-insulator (001) and (110) PMOSFETs: C-V characteristics, mobility, and ON current

Pham, Anh-Tuan; Zhao, Qing-Tai; Jungemann, Christoph; Meinerzhagen, Bernd; Manti, Siegfried; Soree, Bart; Pourtois, Geoffrey

Amsterdam [u.a.] : Elsevier (2011)
Contribution to a conference proceedings, Journal Article

In: Solid state electronics : SSE
Volume: 65
Issue: November-December 2011
Page(s)/Article-Nr.: 64-71