Interface states charges as a vital component for HC degradation modeling

Tyaginov, S. E.; Starkov, I. A.; Triebl, O.; Cervenka, J.; Jungemann, Christoph; Carniello, S.; Park, J. M.; Enichlmair, H.; Karner, M.; Kernstock, C.; Seebacher, E.; Minixhofer, R.; Ceric, H.; Grasser, T.

Gaeta (2014)
Contribution to a conference proceedings

In: [ESREF 2014 : 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis] : 29.09. - 02.10.2014 - TU Berlin
Page(s)/Article-Nr.: 3 S.