Investigation of Electronic Noise in THz SiGe HBTs by Microscopic Simulation

Jungemann, Christoph (Corresponding author); Hong, Sung-Min

Piscataway, NJ : IEEE Service Center (2013)
Contribution to a book, Contribution to a conference proceedings

In: Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE
Page(s)/Article-Nr.: 8 S.