Hot-carrier degradation caused interface state profile; Simulation versus experiment

Starkov, I. A.; Tyaginov, S. E.; Enichlmair, H.; Cervenka, J.; Jungemann, Christoph; Carniello, S.; Park, J. M.; Ceric, H.; Grasser, T.

New York, NY : American Institute of Physics [u.a.] (2011)
Journal Article

In: Journal of vacuum science & technology : JVST / B
Volume: 29
Issue: 1
Page(s)/Article-Nr.: 01AB09