Improving the high-frequency performance of SiGe HBTs by a global additional uniaxial stress
Dinh, Thanh Viet; Hong, Sung-Min; Jungemann, Christoph
Amsterdam : Elsevier (2011)
Journal Article
In: Solid state electronics : SSE
Volume: 60
Issue: 1
Page(s)/Article-Nr.: 58-64
Identifier
- DOI: 10.1016/j.sse.2011.01.027
- RWTH PUBLICATIONS: RWTH-CONV-086125