Validity of Macroscopic Noise Models in the case of High-Frequency Bipolar Transistors

Jungemann, Christoph

Piscataway, NJ : IEEE (2014)
Contribution to a conference proceedings

In: 2014 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2014 ; Workshop 'Compact Modeling -Enabling Better Insight of Device FeaturesSeptember' ; September, 8, 2014, Yokohama, Japan