A Robust Algorithm for Microscopic Simulation of Avalanche Breakdown in Semiconductor Devices

Jabs, Dominic (Corresponding author); Jungemann, Christoph (Corresponding author); Bach, Karl Heinz (Corresponding author)

New York, NY : IEEE (2015)
Journal Article

In: IEEE transactions on electron devices
Volume: 62
Issue: 8
Page(s)/Article-Nr.: 2614-2619