Small signal and microscopic noise simulation of an nMOSFET by a self-consistent, semi-classical and deterministic approach

Ruic, Dino (Corresponding author); Jungemann, Christoph

Piscataway, NJ : IEEE (2015)
Contribution to a book, Contribution to a conference proceedings

In: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2015) : Washington, DC, USA, 9 - 11 September 2015 / [technical sponsor IEEE]
Page(s)/Article-Nr.: 20-23

Abstract