Numerical investigation of plasma effects in silicon MOSFETs for THz-wave detection
Jungemann, Christoph (Corresponding author); Linn, Tobias Sebastian; Bittner, K.; Brachtendorf, H.-G.
Oxford [u.a.] : Pergamon, Elsevier Science (2016, 2017)
Journal Article
In: Solid state electronics
Volume: 128
Page(s)/Article-Nr.: 129-134
Identifier
- DOI: 10.1016/j.sse.2016.10.030
- RWTH PUBLICATIONS: RWTH-2016-12128