Random telegraph noise analysis in redox-based resistive switching devices using KMC simulations

Abbaspour, Elhameh (Corresponding author); Menzel, Stephan (Corresponding author); Jungemann, Christoph (Corresponding author)

Piscataway, NJ : IEEE (2017)
Contribution to a book, Contribution to a conference proceedings

In: SISPAD 2017 : 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : September 7-9, 2017, Kamakura Prince Hotel, Kamakura, Japan / co-sponsored by the Japan Society of Applied Physics, the Murata Science Foundation, Support Center for Advanced Telecommunications Technology Research ; technical co-sponsored by the IEEE Electron Devices Society
Page(s)/Article-Nr.: 313-316


  • Chair and Institute of Theoretical Electrical Engineering [611410]
  • Chair of Materials of Electrical Engineering II and Institute of Materials of Electrical Engineering [611610]