Avalanche breakdown evolution under hot-carrier stress: a new microscopic simulation approach applied to a vertical power MOSFET

Jabs, Dominic (Corresponding author); Bach, Karl Heinz; Jungemann, Christoph

Dordrecht : Springer Science + Business Media B.V. (2018)
Journal Article

In: Journal of computational electronics
Volume: 17
Issue: 3
Page(s)/Article-Nr.: 1249-1256

Identifier