Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics : Part II: Theory

Jech, Markus (Corresponding author); Ullmann, Bianka; Rzepa, Gerhard; Tyaginov, Stanislav; Grill, Alexander; Waltl, Michael; Jabs, Dominic; Jungemann, Christoph; Grasser, Tibor

New York, NY : IEEE (2018, 2019)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 66
Issue: 1
Page(s)/Article-Nr.: 241-248