Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space : Implications and Peculiarities

Jech, Markus (Corresponding author); Rott, Gunnar; Reisinger, Hans; Tyaginov, Stanislav; Rzepa, Gerhard; Grill, Alexander; Jabs, Dominic; Jungemann, Christoph; Waltl, Michael; Grasser, Tibor

New York, NY : IEEE (2020)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 67
Issue: 8
Page(s)/Article-Nr.: 3315-3322

Identifier