First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation

Jech, M.; Tyaginov, S.; Kaczer, B.; Franco, J.; Jabs, Dominic; Jungemann, Christoph; Waltl, M.; Grasser, T.

Piscataway, NJ : IEEE (2019)
Contribution to a book, Contribution to a conference proceedings

In: 2019 International Electron Devices Meeting : technical digest / publisher: IEEE
Page(s)/Article-Nr.: 8993630