Special Issue on New Simulation Methodologies for Next-Generation TCAD Tools

Jungemann, Christoph (Editor); Bonani, Fabrizio (Editor); Cea, Stephen M. (Editor); Gnani, Elena (Editor); Hong, Sung-Min (Editor); Jin, Seonghoon (Editor); Liu, Xiaoyan (Editor); Moroz, Victor (Editor); Verhulst, Anne (Editor)

New York, NY : IEEE (2021)
Book

In: IEEE transactions on electron devices
Volume: 68
Issue: 11
Page(s)/Article-Nr.: 5341-5928, C4 Seiten

Identifier