Microscopic Simulation of the RF Performance of SiGe HBTs With Additional Uniaxial Mechanical Stress

Dieball, Oliver (Corresponding author); Rücker, Holger; Heinemann, Bernd; Jungemann, Christoph

New York, NY : IEEE (2022)
Journal Article

In: IEEE transactions on electron devices : ED
Volume: 69
Issue: 9
Page(s)/Article-Nr.: 4803-4809

Identifier